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Testbench in Combinationl Circuit

To use a testbench in a combinational circuit, you need to follow these steps:

1. We must have a VHDL code that to be tested.

library ieee;
use ieee.std_logic_1164.all;

entity UUT is
    port (
        input_signal1 : in std_logic;
        input_signal2 : in std_logic;
        output_signal1 : out std_logic;
        output_signal2 : out std_logic
    );
end UUT;

architecture rtl of UUT is
begin
    output_signal1 <= input_signal1 and input_signal2;
    output_signal2 <= input_signal1 or input_signal2;
end rtl;

2. Create a testbench for the UUT.

library ieee;
use ieee.std_logic_1164.all;

entity testbench is
end testbench;

architecture tb_arch of testbench is
    signal input_signal1 : std_logic;
    signal input_signal2 : std_logic;
    signal output_signal1 : std_logic;
    signal output_signal2 : std_logic;

    component UUT
        port (
            input_signal1 : in std_logic;
            input_signal2 : in std_logic;
            output_signal1 : out std_logic;
            output_signal2 : out std_logic
        );
    end component;

begin
    UUT_inst : UUT
        port map (
            input_signal1 => input_signal1,
            input_signal2 => input_signal2,
            output_signal1 => output_signal1,
            output_signal2 => output_signal2
        );

    -- Apply stimulus to the UUT
    input_signal1 <= '0';
    input_signal2 <= '1';

    -- Monitor the output signals of the UUT
    process
    begin
        wait for 10 ns;
        assert output_signal1 = '0' and output_signal2 = '1'
            report "Test failed"
            severity error;
        wait;
    end process;

end tb_arch;

Things to note

  • The testbench instantiates the UUT and connects the input and output signals.
  • Entity block in testbench is empty because we are not using any ports.
  • Entity block from UUT re-typed inside architecture block of testbench, entity keyword changed to component keyword.
  • Signal input and output signals are declared in the architecture block of the testbench.
  • Value changes are applied to the input signals with desired delays.